Free Newsletter
Register for our Free Newsletters
Newsletter
Zones
Associations, Services and Universities
LeftNav
Automotive Industry
LeftNav
Design & Manufacturing Services
LeftNav
Education, Training and Professional Services
LeftNav
Electrical Components
LeftNav
Electronic Components
LeftNav
Energy
LeftNav
Fastening and Joining
LeftNav
Laboratory Equipment
LeftNav
Machine Building & Automation
LeftNav
Maintenance, Repair and Overhaul (MRO)
LeftNav
Materials & Processes
LeftNav
Materials Processing and Machine Tools
LeftNav
Mechanical Components
LeftNav
Packaging
LeftNav
View All
Other Carouselweb publications
Carousel Web
Defense File
New Materials
Pro Health Zone
Pro Manufacturing Zone
Pro Security Zone
Web Lec
 
 
Frequency & Tuning Devices
Re-defining device characterisation test through envelope load pull technique
Frequency & Tuning Devices : 03 June, 2013
Mesuro is launching a test that provides the industry substantial benefits in approaches to the device characterization test. The new offering utilises an ′envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.
 
 
Home I Editor's Blog I News by Zone I News by Date I News by Category I Special Reports I Directory I Events I Advertise I Submit Your News I About Us I Guides
 
   © 2012 ProManufacturingZone.com
Netgains Logo